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Panther II - Ultra fast open / short / Diode Drop tester

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Descrizione
  • Designed as an Ultra Fast Open / Short / Diode Drop tester for semi-con industry, where production testing of high pin count devices are involved and test time is critical
  • High speed testing at 2 seconds for 2 million test combinations
  • Can be interfaced to any type of test fixtures
  • Multi-Site Test support for Strip or Multiple device test.
  • 16 Opto Isolated digital outputs for handler interface, binning and PASS / FAIL indicators.
  • 16 Opto Isolated Digital Inputs for Operator console and handler interface.
  • Opto Isolated Digital I/Os are fully programmable for timing compliance of various handlers.
  • Fast turnaround time to test new products.