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Descrizione
Designed as an Ultra Fast Open / Short / Diode Drop tester for semi-con industry, where production testing of high pin count devices are involved and test time is critical High speed testing at 2 seconds for 2 million test combinations Can be interfaced to any type of test fixtures Multi-Site Test support for Strip or Multiple device test. 16 Opto Isolated digital outputs for handler interface, binning and PASS / FAIL indicators. 16 Opto Isolated Digital Inputs for Operator console and handler interface. Opto Isolated Digital I/Os are fully programmable for timing compliance of various handlers. Fast turnaround time to test new products.